Dual Polarisation Interferometry is one of the most sensitive surface science techniques. It can measure the thickness and refractive index of materials at a resolution that other instruments simply can't.

The first commercial instrument was sold in 2002 and Dual Polarization Interferometry and the number of papers published per year continues to grow.

With a strong user base we hope to create a centre here where ideas and help can be provided.

Sub-boards: DPI Papers, Thesis with DPI